Spectroscopic ellipsometry of Ni3Al in comparison with band-structure calculations

P.A.M. van der Heide, J.J.M. Buiting, L.M. ten Dam, L.W.M. Schreurs, R.A. de Groot, A.R. de Vroomen

Research output: Contribution to journalArticleAcademic

16 Citations (Scopus)
343 Downloads (Pure)

Abstract

The optical constants of Ni3Al from 0.5 to 5.3 eV have been determined by means of spectroscopic ellipsometry at room temperature under ultra-high vacuum conditions. Measurements were performed on a single crystal and a polycrystalline sample, which gave identical results. The results are compared with optical properties calculated from band-structure calculation. The experimental results are in good agreement with the predictions from the band-structure calculation.
Original languageEnglish
Number of pages7
JournalJournal of Physics F%3A Metal Physics
Volume15
Issue number5
DOIs
Publication statusPublished - 1985

Fingerprint

Dive into the research topics of 'Spectroscopic ellipsometry of Ni3Al in comparison with band-structure calculations'. Together they form a unique fingerprint.

Cite this