Abstract
This paper introduces a test which can detect all simple faults as well as all linked faults, involving an arbitrary number of simple faults.
Original language | English |
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Title of host publication | Proceedings European Design and Test Conference. ED & TC 97 |
Publisher | IEEE |
Number of pages | 1 |
ISBN (Electronic) | 9780-8186-7786-4 |
DOIs | |
Publication status | Published - 17-Mar-1997 |
Externally published | Yes |
Event | 1997 European Conference on Design and Test, EDTC 1997 - Paris, France Duration: 17-Mar-1997 → 20-Mar-1997 |
Conference
Conference | 1997 European Conference on Design and Test, EDTC 1997 |
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Country/Territory | France |
City | Paris |
Period | 17/03/1997 → 20/03/1997 |