March LA: A test for linked memory faults

A. J. Van De Goor; G. N. Gaydadjiev; V. N. Yarmolik; V. G. Mikitjuk

doi:10.1109/EDTC.1997.582440

March LA: A test for linked memory faults

A. J. Van De Goor, G. N. Gaydadjiev, V. N. Yarmolik, V. G. Mikitjuk

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

2 Citations (Scopus)

Abstract

This paper introduces a test which can detect all simple faults as well as all linked faults, involving an arbitrary number of simple faults.

Original language	English
Title of host publication	Proceedings European Design and Test Conference. ED & TC 97
Publisher	IEEE
Number of pages	1
ISBN (Electronic)	9780-8186-7786-4
DOIs	https://doi.org/10.1109/EDTC.1997.582440
Publication status	Published - 17-Mar-1997
Externally published	Yes
Event	1997 European Conference on Design and Test, EDTC 1997 - Paris, France Duration: 17-Mar-1997 → 20-Mar-1997

Conference

Conference	1997 European Conference on Design and Test, EDTC 1997
Country/Territory	France
City	Paris
Period	17/03/1997 → 20/03/1997

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10.1109/EDTC.1997.582440

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@inproceedings{3053887624b741ad824cfef496c93eb5,

title = "March LA: A test for linked memory faults",

abstract = "This paper introduces a test which can detect all simple faults as well as all linked faults, involving an arbitrary number of simple faults.",

author = "{Van De Goor}, {A. J.} and Gaydadjiev, {G. N.} and Yarmolik, {V. N.} and Mikitjuk, {V. G.}",

year = "1997",

month = mar,

day = "17",

doi = "10.1109/EDTC.1997.582440",

language = "English",

booktitle = "Proceedings European Design and Test Conference. ED & TC 97",

publisher = "IEEE",

note = "1997 European Conference on Design and Test, EDTC 1997 ; Conference date: 17-03-1997 Through 20-03-1997",

}

TY - GEN

T1 - March LA

T2 - 1997 European Conference on Design and Test, EDTC 1997

AU - Van De Goor, A. J.

AU - Gaydadjiev, G. N.

AU - Yarmolik, V. N.

AU - Mikitjuk, V. G.

PY - 1997/3/17

Y1 - 1997/3/17

N2 - This paper introduces a test which can detect all simple faults as well as all linked faults, involving an arbitrary number of simple faults.

AB - This paper introduces a test which can detect all simple faults as well as all linked faults, involving an arbitrary number of simple faults.

UR - http://www.scopus.com/inward/record.url?scp=33751086889&partnerID=8YFLogxK

U2 - 10.1109/EDTC.1997.582440

DO - 10.1109/EDTC.1997.582440

M3 - Conference contribution

AN - SCOPUS:33751086889

BT - Proceedings European Design and Test Conference. ED & TC 97

PB - IEEE

Y2 - 17 March 1997 through 20 March 1997

ER -

March LA: A test for linked memory faults

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