Determining quantitative three-dimensional surface topography from two-dimensional microscopy images

Diego Martinez Martinez (Inventor), Vaclav Ocelik (Inventor), Josephus Theodorus Maria De Hosson (Inventor), Catalina Mansilla Sanchez (Inventor), Enne Theodoor Faber (Inventor)

    Research output: Patent

    Abstract

    Sets of displacements of corresponding points between a first image and a second and third image are determined. Directional components in two directions of each set of displacements are fitted to two respective fitting planes. From the directional components, the relative displacements, each indicating a difference between the displacement of corresponding points and a calculated displacement of corresponding points on the respective fitting plane are calculated. An orientation of a sample plane for each image and the angle and the axis of rotation of the sample plane is calculated by requiring that for at least two types of physical parameters, the value resulting from the first set of displacements is identical to the value resulting from the second set of displacements. Three-dimensional surface topography data are determined from the calculated orientations and the angle and axis of rotation of the sample plane and the first or second relative displacements.
    Original languageEnglish
    Patent numberWO2015185538
    Priority date02/06/2014
    Publication statusPublished - 10-Dec-2015

    Fingerprint

    Dive into the research topics of 'Determining quantitative three-dimensional surface topography from two-dimensional microscopy images'. Together they form a unique fingerprint.

    Cite this